Lehigh University is seeking a research scientist to supervise and operate its state-of-the-art surface analysis facility.The position is available immediately. There are currently two major state-of-the-art instruments: the ION-TOF Qtac100 high sensitivity-low energy ion scattering (HS-LEIS) system and the SPECS near ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) system. The ION-TOF Qtac100 is a cutting edge, first of such an instrument in North America. The SPECS instrument was delivered and brought online in 2019 and is unique in its ability to measure X-ray photoelectron spectra at relatively high pressures.
We are seeking an outstanding individual who is interested in working with interdisciplinary groups within and outside Lehigh on surface analysis related matters. The ability and willingness to work with colleagues in different disciplines is important. Preference will be given to applicants with a broad range of experience using surface analysis methods and a familiarity with vacuum technology and modern electronics. A Ph.D. in Physics, Chemistry, Chemical Engineering, Materials Science, or similar discipline is desirable.
Primary job responsibilities will be to supervise, operate, and maintain both instruments, to assist with surface science investigations using these instruments, and to train users on instrument operation. The incumbent will be expected to mentor graduate students and postdocs in the use of surface analytical methods and to assist and/or collaborate with faculty members in their research. Other activities include working with industrial users in conducting surface analysis investigations, which may include aiding in experimental design, sample preparation, measurement of samples, interpretation of data, and writing of reports. Thus, this position will require the staff member to analyze a broad variety of samples, including metal single crystals, semiconductor wafers, ceramic powders, catalysts, insulators, glasses, polymers, biomaterials, and rough samples.
The primary components of the ION-TOF Qtac100 HS-LEIS system are the Calipso LEIS analyzer in the main chamber, a sample introduction system with sample transfer, plasma source for atomic O/H used for sample pre-treatment and sample heating. This instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling. The key features are 3000 times higher sensitivity than conventional LEIS instruments, quantitative elemental characterization of the topmost atomic layer, spectroscopy, time-of-flight mass filtering for improved sensitivity to low-Z elements such as carbon, and analysis of rough and non-conductive materials. It is also integrated with a high-pressure pre-treatment/reaction chamber and multiple sample capabilities.
The SPECS NAP-XPS is a specialized research instrument that allows for locally high pressures near the sample (up to 25 mbar). The instrument can be used for both ultra-high vacuum (UHV) and near-ambient pressure experiments. For UHV measurements, in-situ heating and sputter depth profiling of samples are also available. For near-ambient pressure experiments, the instrument is also equipped with an online mass spectrometer for operando spectroscopy studies. The instrument is also capable of incorporating several in-situ optical spectroscopy measurements (IR absorption, Raman scattering and UV-vis diffuse reflection spectroscopy).
Lehigh University is an affirmative action/equal opportunity employer and does not discriminate on the basis of age, color, disability, gender, gender identity, genetic information, marital status, national or ethnic origin, race, religion, sexual orientation, or veteran status.
Please e-mail resume or CV with contact information for at least three references.
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